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  • Understanding Nickel Thin Film crystallization using X-Ray Diffractometry 

    Otiti, T.; Ekosse, G-I.; Stephen, S.T. (Bioline International. http://www.ajol.info/journal_index.php?jid=90, 2007-06)
    Normal, helical and zigzag deposited Ni films were produced by letting a vapour stream of source material impinge on Corning 1737 glass substrates at oblique incidence while rotating the substrate during deposition. Films ...