Now showing items 1-1 of 1

  • Understanding Nickel Thin Film crystallization using X-Ray Diffractometry 

    Otiti, T.; Ekosse, G-I.; Stephen, S.T. (Bioline International., 2007-06)
    Normal, helical and zigzag deposited Ni films were produced by letting a vapour stream of source material impinge on Corning 1737 glass substrates at oblique incidence while rotating the substrate during deposition. Films ...