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dc.contributor.authorKumar, P.
dc.contributor.authorSathiaraj, T.S.
dc.contributor.authorThangaraj, R.
dc.date.accessioned2010-07-13T12:33:41Z
dc.date.available2010-07-13T12:33:41Z
dc.date.issued2010
dc.identifier.citationKumar, P. et al (2010) Optical properties of amorphous Sb2Se3:Sn films, Philosophical Magazine Letters, Vol. 90, No. 3, pp. 183-192en_US
dc.identifier.issn0950-0839 (print)
dc.identifier.issn1362-3036 (online)
dc.identifier.urihttp://hdl.handle.net/10311/547
dc.description.abstractThe measurements and analysis of optical transmission and far-infrared (IR) reflectivity spectra of thermally evaporated Sb2Se3:Sn films are reported. The refractive index and film thickness have been determined from the upper and lower envelopes of the transmission spectra (Swanepoel’s standard envelope method), measured at normal incidence, in the spectral range from 800 to 2500 nm. Values of the refractive index fit well to Cauchy’s dispersion relation. The optical gap decreases with an increase in the Sn content, while a maximum in the tailing parameter and Urbach’s energy occurs with only a small amount ( 1 at %) of this additive. Characteristic vibrational bands for SbSe3 structural units are revealed in the far-IR spectrum with no additional ones arising from the Sn additive. The Kramers–Kronig analysis has been used to calculate the dielectric constants and hence the longitudinal optic and transverse optic splitting for various compositions. The inclusion of Sn as a charged entity along with the Coulomb interactions which serve to polarize the glass medium is found to be responsible for these results.en_US
dc.language.isoenen_US
dc.publisherTaylor & Francisen_US
dc.subjectAmorphous semiconductorsen_US
dc.subjectThin filmsen_US
dc.subjectChalcogenide glassesen_US
dc.subjectOptical propertiesen_US
dc.subjectRefractive indexen_US
dc.subjectFar-infrared reflectivityen_US
dc.titleOptical properties of amorphous Sb2Se3:Sn filmsen_US
dc.typePublished Articleen_US
dc.linkhttp://www.informaworld.comen_US


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